Characterization of GaN thin film growth on 3C–SiC/Si(111) substrate using various buffer layers
- 30 April 2001
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 224 (3-4) , 190-194
- https://doi.org/10.1016/s0022-0248(01)00856-9
Abstract
No abstract availableKeywords
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