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Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
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Publications
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
R. Lüthi
R. Lüthi
E. Meyer
E. Meyer
MB
M. Bammerlin
M. Bammerlin
AB
A. Baratoff
A. Baratoff
TL
T. Lehmann
T. Lehmann
LH
L. Howald
L. Howald
CG
Ch. Gerber
Ch. Gerber
HG
H.-J. Güntherodt
H.-J. Güntherodt
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1 March 1996
journal article
rapid note
Published by
Springer Nature
in
Zeitschrift für Physik B Condensed Matter
Vol. 100
(2)
,
165-167
https://doi.org/10.1007/s002570050106
Abstract
No abstract available
Keywords
07.79
Cited
Cited by 86 articles
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