Measuring surface variations with the scanning electron microscope using lines of evaporated metal
- 1 October 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (10) , 803-804
- https://doi.org/10.1088/0022-3735/9/10/002
Abstract
A technique is described, as a modification of that published by Hoover (1971) in which straight-line edges of metal evaporated onto a specimen are used for measuring surface variations with a scanning electron microscope. Scanning electron micrographs are presented demonstrating the application of the technique.Keywords
This publication has 1 reference indexed in Scilit:
- Measuring surface variations with the scanning electron microscope using deposited contamination linesJournal of Physics E: Scientific Instruments, 1971