Ellipsometric characterization of thin films and superlattices
- 31 January 1990
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 5 (2) , 285-289
- https://doi.org/10.1016/0921-5107(90)90070-r
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Infrared SpectropolarimetryOptical Engineering, 1989
- Optical properties of thin films and the Berreman effectApplied Physics A, 1985
- XXVI. Optical constants of metals in the infra-red—experimental methodsJournal of Computers in Education, 1955