Simplified Critical Values for the Sign Test
- 1 April 1984
- journal article
- other
- Published by Taylor & Francis in Journal of Quality Technology
- Vol. 16 (2) , 125-126
- https://doi.org/10.1080/00224065.1984.11978899
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Survey of Sign Tests Based on the Binomial DistributionJournal of Quality Technology, 1969
- Table for Both the Sign Test and Distribution-Free Confidence Intervals of the Median for Sample Sizes to 1,000Journal of the American Statistical Association, 1964
- Rapid Statistical Techniques for Operational Research WorkersJournal of the Operational Research Society, 1958