Optical Measurement of Oxide Thickness on Titanium*
- 1 April 1962
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 52 (4) , 427-431
- https://doi.org/10.1364/josa.52.000427
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 6 references indexed in Scilit:
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- preparation, properties and optical applications of thin films of titanium dioxideVacuum, 1952
- Optical Determination of Thin Films on Reflecting Bases in Transparent EnvironmentsJournal of the Optical Society of America, 1948
- Optical methods of studying films on reflecting bases depending on polarisation and interference phenomenaTransactions of the Faraday Society, 1946
- Plane waves of lightII Reflection and refractionJournal of the Optical Society of America, 1928