Application of synchrotron radiation to high resolution powder diffraction and rietveld refinement
- 15 April 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 208 (1-3) , 573-578
- https://doi.org/10.1016/0167-5087(83)91185-7
Abstract
No abstract availableKeywords
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