Electrical Impact of SiC Structural Crystal Defects on High Electric Field Devices

• 10 May 2000
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 338-342, 1161-1166
• https://doi.org/10.4028/www.scientific.net/msf.338-342.1161

Abstract

Keywords

• AVALANCHE BREAKDOWN
• CRYSTAL DEFECT
• DIODE
• EPILAYER GROWTH PITS
• MICROPIPE
• MICROPLASMAS
• P-N JUNCTION
• RECTIFIER
• RELIABILITY
• SAFE OPERATING AREA
• SCHOTTKY DIODE
• SCREW DISLOCATIONS