Investigations into Ripple Wavelength in Evaporated Thin Films by Lorentz Microscopy

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Abstract
A systematic experimental study of ripple wavelength by Lorentz microscopy in NiFe alloy films was carried out. The following should be noted: 1. The only possible way to determine experimentally a meaningful wavelength is to evaluate visually well‐defined ripple high‐contrast lines on a photomicrograph. 2. The average wavelength determined in this way is of the order of 1 μm. This value is in reasonable agreement with the main wavelength predicted by the theories developed by others. However, the predicted slight dependence of this observed wavelength on substrate deposition temperature and alloy composition was not observed. On the other hand, the strong dependence of the measured wavelength on the external magnetic fields is in good agreement with that predicted theoretically.