An experimental method for the determination of the saturation point of a MOSFET
- 1 February 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 31 (2) , 247-251
- https://doi.org/10.1109/T-ED.1984.21508
Abstract
This paper presents an extraction technique which determines the drain voltages and currents at saturation directly from experimental data. The technique makes use of both drain current and conductance data. In addition to VDSSand IDSS, parameters for the characterization of the saturation region of operation may be extracted via this technique.Keywords
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