The application of deep level transient spectroscopy to the measurement of radiation-induced interface state spectra
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 35 (6) , 1197-1202
- https://doi.org/10.1109/23.25439
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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- DiscussionIEEE Transactions on Nuclear Science, 1965