Determining plane orientation from specular reflectance
- 31 December 1985
- journal article
- Published by Elsevier in Pattern Recognition
- Vol. 18 (1) , 53-62
- https://doi.org/10.1016/0031-3203(85)90006-8
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Understanding image intensitiesArtificial Intelligence, 1977