Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS
- 1 January 1980
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 168 (1-3) , 367-371
- https://doi.org/10.1016/0029-554x(80)91277-x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometryApplied Physics A, 1979
- Anomalous enhancement of negative sputtered ion emission by oxygenSurface Science, 1978
- Surface layers on cadmium tellurideJournal of Physics D: Applied Physics, 1978
- Current possibilities and limitations of cadmium telluride detectorsNuclear Instruments and Methods, 1978
- Surface analysis by argon ion induced X-ray fluorescenceNuclear Instruments and Methods, 1978
- Purification of CdTe from, tellurium-rich solutionsJournal of Electronic Materials, 1974
- Extension of the Electron-Promotion Model to Asymmetric Atomic CollisionsPhysical Review A, 1972
- Cadmium telluride, grown from tellurium solution, as a material for nuclear radiation detectorsPhysica Status Solidi (a), 1970
- Interpretation of-Ar Collisions at 50 KeVPhysical Review Letters, 1965