Electrochemical Photocapacitance Spectroscopy: A New Method for Characterization of Deep Levels in Semiconductors
- 1 April 1982
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 129 (4) , 891-893
- https://doi.org/10.1149/1.2123996
Abstract
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