An ellipsometer for following film growth
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 155-165
- https://doi.org/10.1016/0039-6028(69)90014-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Computer-Operated Following EllipsometerApplied Optics, 1967
- Ellipsometric-Potentiostatic Studies of Iron PassivityJournal of the Electrochemical Society, 1967
- Correlation Between Ellipsometric and Electrical Measurements on Passive IronJournal of the Electrochemical Society, 1966