Comparison Between FT-IR and XPS Characterization of Carbon Fiber Surfaces
- 1 September 1995
- journal article
- research article
- Published by Taylor & Francis in The Journal of Adhesion
- Vol. 52 (1) , 167-186
- https://doi.org/10.1080/00218469508015192
Abstract
Fourier transform infrared internal reflection spectroscopy and X-ray photoelectron spectroscopy XPS have been applied to investigate the surface of polyacrylonitrile-based carbon fibers treated by chemical oxidation and electrochemical oxidation. We have found that infrared spectroscopy has comparable sensitivity to XPS and that the amount of the functionality introduced at the fiber surface depends on the oxidation time in the case of chemical oxidation and on the electrolyte used in the case of electrochemical oxidation.Keywords
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