Some Preliminary Electron Microscope Observations on NiO Bombarded by Ions or Electrons
- 1 May 1965
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 4 (5)
- https://doi.org/10.1143/jjap.4.368
Abstract
From electron micrographs and the corresponding diffraction patterns obtained for NiO bombarded by ions (air, 1∼2 kv.) or electrons (100 kv.), the following results have been obtained. (1) Images of ion damages are similar to those in other substances and can be annealed out at 1200°C in air. Lamellar structure (spacing: ∼50 Å) and superlattice reflections are sometime detected in the annealed specimens. (2) Microstructures of the electron bombarded NiO can be classified into the following four types: (a) The annealed structure. (b) The aggregation of thin (in <111> or [001]) crystallites. (c) The dense distribution of Ni particles (several hundred Å in diameter) over the (001) surface of NiO with the orientation: (001)Ni//(001)NiO, [100]Ni//[100]NiO. (d) The coarser distribution of larger Ni particles, which keep orientation relationships of a pair of spinel twins among themselves.Keywords
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