High resolution electron microscopy
- 1 January 1979
- proceedings article
- Published by AIP Publishing in AIP Conference Proceedings
- Vol. 53 (1) , 55-68
- https://doi.org/10.1063/1.31821
Abstract
Recent developments in high resolution electron microscopy as a tool for the study of local variations of structure in crystals at atomic resolution is summarized. Limitations of the method are discussed in terms of the instrumental factors and the nature of specimens. Problems for the future development of the method are also considered.Keywords
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