Two-Dimensional Mapping of Chemical Information at Atomic Resolution
Top Cited Papers
- 22 August 2007
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 99 (8) , 086102
- https://doi.org/10.1103/physrevlett.99.086102
Abstract
The simultaneous measurement of structural and chemical information at the atomic scale provides fundamental insights into the connection between form and function in materials science and nanotechnology. We demonstrate structural and chemical mapping in using an aberration-corrected scanning transmission electron microscope. Two-dimensional mapping is made possible by an adapted method for fast acquisition of electron energy-loss spectra. The experimental data are supported by simulations, which help to explain the less intuitive features.
Keywords
This publication has 26 references indexed in Scilit:
- Absorption spectroscopy with sub-angstrom beams: ELS in STEMReports on Progress in Physics, 2006
- Spectroscopic Imaging of Single Atoms Within a Bulk SolidPhysical Review Letters, 2004
- Scattering of Å-scale electron probes in siliconUltramicroscopy, 2003
- Atomic-Resolution Electron Energy Loss Spectroscopy Imaging in Aberration Corrected Scanning Transmission Electron MicroscopyPhysical Review Letters, 2003
- Welcome to San AntonioMicroscopy and Microanalysis, 2003
- Sub-ångstrom resolution using aberration corrected electron opticsNature, 2002
- Artificial bright spots in atomic-resolution high-angle annular dark field STEM images.QJM: An International Journal of Medicine, 2001
- Atomic-resolution annular dark-field STEM image calculationsPhysical Review B, 2001
- Prospects of atomic resolution imaging with an aberration-corrected STEMQJM: An International Journal of Medicine, 2001
- The electronic structure at the atomic scale of ultrathin gate oxidesNature, 1999