Optical Waveguiding In An Epitaxial Layer Of Silicon-Germanium Grown On Silicon

Abstract
Low-loss waveguiding at X = 1.3 µm has been observed in a partially strained, 10-µm thick, single-crystal layer of Ge0,1Si0.9 grown by chemical vapor deposition on a high-resistivity (100) silicon substrate. The TM-mode propagation loss in the multimode planar guide was less than 1.9 dB/cm. Device applications of GeSi waveguides are discussed.

This publication has 0 references indexed in Scilit: