Effect of enhanced current crowding in a CPW withathin ferroelectric film

16 January 1997

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 33 (2) , 145-146
https://doi.org/10.1049/el:19970103

Abstract

Enhanced current crowding is predicted at the edges of the conducting strips in thin ferroelectric film coplanar waveguides (CPWs). A minimum current crowding depth is expected, which depends on the CPW geometry and dielectric constant of the ferroelectric film. In practical CPW devices the enhanced current crowding can increase the conductor losses by up to four times. The current crowding depth may be smaller than the skin depth or London penetration depth (for high temperature superconducting CPW).

Keywords

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