Comparison of random test vector generation strategies

Publisher Website

10 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iccad.1991.185243

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Advanced automatic test pattern generation and redundancy identification techniques
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
An Information Theoretic Approach to Digital Fault Testing
IEEE Transactions on Computers, 1981