Method of Standard Spectrum Fitting for the Analysis of Gamma-Ray Spectra from Semiconductor Detectors
- 1 January 1972
- journal article
- Published by Taylor & Francis in Journal of Nuclear Science and Technology
- Vol. 9 (7) , 430-432
- https://doi.org/10.3327/jnst.9.430
Abstract
(1972). Method of Standard Spectrum Fitting for the Analysis of Gamma-Ray Spectra from Semiconductor Detectors. Journal of Nuclear Science and Technology: Vol. 9, No. 7, pp. 430-432.This publication has 0 references indexed in Scilit: