Spin-orbit scattering in thin films and on surfaces measured by weak localization

Abstract
Magnetoresistance measurements on thin disordered films yield the spin-orbit scattering time τso of the conduction electrons by means of weak localization. The spin-orbit scattering is used to check the time scale of weak localization. The dependence of τso on the residual resistivity of Ag films is measured, and the strength of the spin-orbit scattering of an Au atom at the surface and in the bulk of Mg is compared.