Spin-orbit scattering in thin films and on surfaces measured by weak localization
- 15 January 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 31 (2) , 1161-1163
- https://doi.org/10.1103/physrevb.31.1161
Abstract
Magnetoresistance measurements on thin disordered films yield the spin-orbit scattering time of the conduction electrons by means of weak localization. The spin-orbit scattering is used to check the time scale of weak localization. The dependence of on the residual resistivity of Ag films is measured, and the strength of the spin-orbit scattering of an Au atom at the surface and in the bulk of Mg is compared.
Keywords
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