Transient thermoreflectance of thin metal films in the picosecond regime
- 1 April 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (7) , 2391-2395
- https://doi.org/10.1063/1.341057
Abstract
The distributed nature of the reflection process is considered for pump‐and‐probe‐type picosecond transient thermoreflectance (PTTR) measurements. A first‐order approximation is given for the temporal dependence of the reflectivity for temperature distributions created by picosecond laser pulses. It was found that PTTR flashes back the temperature profile created by the pump pulse. The problem of determining the thermal transport properties from PTTR measurements is discussed.This publication has 8 references indexed in Scilit:
- Picosecond interferometric technique for study of phonons in the brillouin frequency rangeOptics Communications, 1986
- Transient thermoreflectance from thin metal filmsJournal of Applied Physics, 1986
- Transient thermoreflectance from metal filmsOptics Letters, 1986
- Detection of thermal waves through optical reflectanceApplied Physics Letters, 1985
- Thermal diffusivity in thin films measured by noncontact single-ended pulsed-laser-induced thermal radiometryOptics Letters, 1984
- Shot-noise-limited detection scheme for two-beam laser spectroscopiesReview of Scientific Instruments, 1984
- Photothermal displacement spectroscopy: An optical probe for solids and surfacesApplied Physics A, 1983
- Thermal-wave detection and thin-film thickness measurements with laser beam deflectionApplied Optics, 1983