Multilayer X-ray mirrors prepared by triode sputtering using a new method of film thickness monitoring
- 1 January 1986
- Vol. 36 (1-3) , 121-123
- https://doi.org/10.1016/0042-207x(86)90284-8
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954