Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements
- 1 March 1994
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 24 (1-4) , 377-384
- https://doi.org/10.1016/0167-9317(94)90089-2
Abstract
No abstract availableKeywords
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