Film adhesion studies with the acoustic microscpe
- 1 December 1980
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 74 (2) , 295-302
- https://doi.org/10.1016/0040-6090(80)90093-0
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ray interpretation of the material signature in the acoustic microscopeElectronics Letters, 1979
- The Acoustic MicroscopeScientific American, 1979
- An angular-spectrum approach to contrast in reflection acoustic microscopyJournal of Applied Physics, 1978
- Acoustic microscopy at optical wavelengthsApplied Physics Letters, 1978
- Adhesion Measurement of Thin FilmsActive and Passive Electronic Components, 1976