Simplified Technique for Positioning Small Diameter X-Ray Beams on Specimens for Back Reflection Analysis
- 1 May 1962
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 33 (5) , 572-573
- https://doi.org/10.1063/1.1717935
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Improved microbeam back-reflexion X-ray camera with arrangement for irradiating a pre-selected areaJournal of Scientific Instruments, 1959