Computer simulation of the post-nucleation growth of thin amorphous germanium films
- 1 January 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 48 (2) , 163-174
- https://doi.org/10.1016/0040-6090(78)90238-9
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Cluster size and boundary distribution near percolation thresholdPhysical Review B, 1976
- Cluster Shape and Critical Exponents near Percolation ThresholdPhysical Review Letters, 1976
- Obliquely deposited amorphous Ge films. I. Growth and structureJournal of Applied Physics, 1975
- Simulation of structural anisotropy and void formation in amorphous thin filmsApplied Physics Letters, 1974
- On Variable Range Hopping near the Fermi Energy. Two‐Dimensional SystemsPhysica Status Solidi (b), 1974
- Computer‐Generated Structures of Amorphous GePhysica Status Solidi (b), 1973
- Shape stability of a two-dimensional nucleusJournal of Crystal Growth, 1972
- Effect of vapour incidence angles on profile and properties of condensed filmsThin Solid Films, 1972
- High-Resolution Electron Microscope Observation of Voids in Amorphous GePhysical Review Letters, 1971
- Role of Surface Diffusion in Stabilizing the Surface of a Solid Growing from Solution or VaporJournal of Applied Physics, 1966