B-test of homogeneity

• 1 January 1987
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 27  (4) , 639-641
• https://doi.org/10.1016/0026-2714(87)90008-4

Abstract

Keywords

• BETA DISTRIBUTION
• TEST OF HOMOGENEITY
• CONFIDENCE LIMITS
• ILLUSTRATIVE EXAMPLES
• TWO ILLUSTRATIVE
• DISTRIBUTION FUNCTION