Analysis and scaling of Kelvin resistors for extraction of specific contact resistivity
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Electron Device Letters
- Vol. 6 (3) , 105-108
- https://doi.org/10.1109/EDL.1985.26061
Abstract
No abstract availableThis publication has 0 references indexed in Scilit: