Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
Top Cited Papers
- 9 August 2000
- journal article
- Published by Elsevier in Optics Communications
- Vol. 182 (4-6) , 321-328
- https://doi.org/10.1016/s0030-4018(00)00826-9
Abstract
No abstract availableKeywords
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