The Observation of Stacking Faults in Silicon by Transmission Electron Microscopy
- 1 January 1962
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 33 (1) , 240-241
- https://doi.org/10.1063/1.1728508
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Thermally Precipitated Phases and their Distribution in an Aluminum-Silicon-Cadmium AlloyJournal of Applied Physics, 1958
- Electron diffraction from crystals containing stacking faults: IPhilosophical Magazine, 1957