High-resolution TEM and analytical study of second-phase particles in Al2O3
- 1 August 1983
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 41, 46-47
- https://doi.org/10.1017/s042482010007415x
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Irradiation-induced defects in β''-alumina examined by 1 MV high-resolution electron microscopyActa Crystallographica Section A, 1981
- High-resolution electron microscopy images of defects in Mg- and Li-stabilized β''-aluminasActa Crystallographica Section A, 1979
- Additive and Impurity Distributions at Grain Boundaries in Sintered AluminaJournal of the American Ceramic Society, 1975