Application of X-ray synchrotron topography toin situstudies of recrystallization

• 1 February 1978
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 11  (1) , 40-43
• https://doi.org/10.1107/s0021889878012649

Abstract