A new method for determining relaxation energies by means of aes and xps and its application to silicon compounds
- 1 January 1983
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 31 (2) , 131-143
- https://doi.org/10.1016/0368-2048(83)80016-4
Abstract
No abstract availableKeywords
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