Multiple faults in Reed-Muller canonic networks
Open Access
- 1 October 1972
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 185-191
- https://doi.org/10.1109/swat.1972.9
Abstract
Fault detecting test sets to detect multiple stuck-at-faults in certain networks realizing Reed-Muller canonic expressions are given. It is shown that to detect t faults, t ≥ 1, in a network realizing an arbitrary n-variable logic function only 4 + Σ i=1 [log22t] (in) tests need be applied ([x] is the integer part of x) and that these tests are independent of the function being realized. Techniques to design the checker for these test sets are given.Keywords
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- Application of Boolean algebra to switching circuit design and to error detectionTransactions of the I.R.E. Professional Group on Electronic Computers, 1954