On the development of InAs on GaAs(001) as measured by reflectance anisotropy spectroscopy: continuous and islanded films
- 1 January 1998
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 123-124, 347-351
- https://doi.org/10.1016/s0169-4332(97)00525-4
Abstract
No abstract availableKeywords
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