On the shape optimization of magnetic random access memory element design
- 15 May 2003
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 93 (10) , 8376-8378
- https://doi.org/10.1063/1.1555973
Abstract
In designing the shape of magnetic random access memory elements, a sufficient difference in switching current threshold between a full-select element and a half-select memory element is critical. In this article, we present a systematic micromagnetic study of the margin of switching threshold for two specific shapes: eye shaped and ellipse. It is found that at small magnetic thickness, the eye-shaped element exhibits a higher switching threshold margin than the ellipse. However, for relatively thick storage layers, the opposite becomes true. The switching threshold is also a strong function of the initial magnetization state for the ellipse.This publication has 6 references indexed in Scilit:
- Ultrahigh density vertical magnetoresistive random access memory (invited)Journal of Applied Physics, 2000
- Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)Journal of Applied Physics, 1999
- High density submicron magnetoresistive random access memory (invited)Journal of Applied Physics, 1999
- The effect of end and edge shape on the performance of pseudo-spin valve memoriesIEEE Transactions on Magnetics, 1998
- Switching field variation in patterned submicron magnetic film elementsJournal of Applied Physics, 1997
- Microstructured magnetic tunnel junctions (invited)Journal of Applied Physics, 1997