Application Of Maximum-Entropy Spectrum Analysis To The Measurement Of Low-Frequency Radiographic Noise Spectra

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Abstract
The maximum-entropy method (MEM) for computing noise spectra has been extended to accommodate two-dimensional microdensitometric scans of uniformly exposed radiographs. Based on computer-simulated short scans, the MEM requires one-tenth the data of the conventional FFT method, for the same statistical stability. In particular, MEM estimates of very low-frequency noise power have proved to be substantially more stable than FFT estimates. MEM spectra also have the advantage of being smoother than the FFT method. For measured data, we found the results to be quite sensitive to the nature of the detrending algorithm which was applied to the raw data.

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