Étude par diffraction de rayons X de films à base d'oxydes d'étain et d'indium
- 1 October 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 18 (1) , 117-125
- https://doi.org/10.1016/0040-6090(73)90229-0
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- On the structure of indium oxide-tin oxide transparent conducting films by electron diffraction and electron spectroscopyThin Solid Films, 1973
- A plasma source for the production of thin oxide filmsThin Solid Films, 1972
- Aspects chimiques de la formation de films d'oxydes d'etain par pulverisation reactiveThin Solid Films, 1972
- Highly Conductive, Transparent Films of Sputtered In[sub 2−x]Sn[sub x]O[sub 3−y]Journal of the Electrochemical Society, 1972
- Liquid-Crystal Display DevicesScientific American, 1970
- Electrical and Optical Properties of Sputtered In2O3 films. I. Electrical Properties and Intrinsic AbsorptionPhysica Status Solidi (b), 1968
- Optical Properties of Indium OxideJournal of Applied Physics, 1966