A new method for high-resolution measurement of semiconductor laser linewidth in coherent optical systems
- 1 October 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 1 (10) , 327-328
- https://doi.org/10.1109/68.43363
Abstract
A method for the observation of laser linewidth during operation in a coherent optical system is presented. The measurements agree well with the theoretical calculations and show that the power density spectrum of the backscattered intensity from a single-mode fiber corresponds to the laser spectrum with twice the source linewidth, shifted to baseband.Keywords
This publication has 1 reference indexed in Scilit:
- Statistical properties of Rayleigh backscattering in single-mode fibersJournal of Lightwave Technology, 1990