Determination of epitaxic-layer composition and thickness by double-crystal X-ray diffraction

Publisher Website

1 June 1989

journal article
Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography

Vol. 22 (3) , 269-276
https://doi.org/10.1107/s0021889888014773

Abstract

No abstract available

Keywords

X RAY DIFFRACTION

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