Additional Power VMOS Radiation Effects Studies
- 1 January 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 27 (4) , 1329-1331
- https://doi.org/10.1109/TNS.1980.4331014
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- MOS Hardness Characterization and Its Dependence upon Some Process and Measurement VariablesIEEE Transactions on Nuclear Science, 1976