Interference method for the determination of the complex refractive index of thin polymer layers
- 6 August 2007
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 91 (6) , 061901
- https://doi.org/10.1063/1.2767232
Abstract
The optical properties of thin-film layers are described by the complex index-of-refraction ( N ) and are commonly measured using spectroscopic ellipsometry. Once determined, they can be used to predict the optical reflection and transmission from films of any thickness. Fitting of the spectroscopic ellipsometry data for thin-filmpolymers and polymer-blends is difficult because numerous numerical assumptions are necessary and optical birefringence must be accounted for. Ellipsometric fitting techniques fail for thin films with strong absorption and high surface roughness. The authors present a simple method to measure N , perpendicular to the sample plane, of optically homogeneous films using a UV/Vis spectrometer and partial transmission substrates.This publication has 14 references indexed in Scilit:
- On the optical anisotropy of conjugated polymer thin filmsPhysical Review B, 2005
- Ellipsometric Characterization of the Optical Constants of Polyfluorene Gain MediaAdvanced Functional Materials, 2005
- Nanoscale Morphology of High-Performance Polymer Solar CellsNano Letters, 2005
- Nanoscale Morphology of Conjugated Polymer/Fullerene‐Based Bulk‐ Heterojunction Solar CellsAdvanced Functional Materials, 2004
- Morphology effects in nanocrystalline CuInSe2-conjugated polymer hybrid systemsApplied Physics A, 2004
- Modeling the optical absorption within conjugated polymer/fullerene-based bulk-heterojunction organic solar cellsSolar Energy Materials and Solar Cells, 2003
- Small molecular weight organic thin-film photodetectors and solar cellsJournal of Applied Physics, 2003
- Ellipsometric Determination of Anisotropic Optical Constants in Electroluminescent Conjugated PolymersAdvanced Materials, 2002
- Measurement of the Anisotropic Refractive Indices of Spin Cast Thin Poly(2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylenevinylene) (MEH-PPV) FilmsAdvanced Materials, 2002
- Modeling photocurrent action spectra of photovoltaic devices based on organic thin filmsJournal of Applied Physics, 1999