Continuous X-ray induced Auger microprobe analysis and microscopy: First results
- 2 June 1983
- journal article
- Published by Elsevier in Surface Science
- Vol. 129 (1) , 247-264
- https://doi.org/10.1016/0039-6028(83)90106-1
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Continuous X-ray-induced Auger electron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1983
- Detection sensitivity for surface atoms in X-ray photoelectron spectroscopy and X-ray-induced Auger electron spectroscopyApplications of Surface Science, 1982
- Bremsstrahlung-induced Auger transitions and photoemission in elemental red phosphorusZeitschrift für Physik B Condensed Matter, 1981
- Bremsstrahlung excited Auger spectroscopyJournal of Vacuum Science and Technology, 1981
- Electron beam damage in Auger electron spectroscopyApplications of Surface Science, 1981
- The utility of Bremsstrahlung-induced Auger peaksJournal of Electron Spectroscopy and Related Phenomena, 1979
- Low beam current density Auger spectroscopy and surface analysisSurface Science, 1977
- Microanalyse et microscopie photoélectroniques X: principe et performances prévisiblesRevue de Physique Appliquée, 1975
- Beam effects in AES revealed by XPSFaraday Discussions of the Chemical Society, 1975
- Back Scattering of ElectronsJournal of Applied Physics, 1961