Refractive index of vacuum-evaporated SiO thin films: Dependence on substrate temperature
- 1 October 1990
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 191 (1) , 13-19
- https://doi.org/10.1016/0040-6090(90)90269-j
Abstract
No abstract availableKeywords
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