Ion beam synthesis of compound nanoparticles in SiO2

• 1 January 1999
• journal article
• Published by Springer Nature in Journal of Materials Science: Materials in Electronics
• Vol. 10  (5/6) , 385-391
• https://doi.org/10.1023/a:1008953608585

Abstract

Keywords

• RAMAN SPECTROSCOPY
• SIO2 LAYER
• OPTOELECTRONIC APPLICATION
• DAMAGE DISTRIBUTION
• ANNEALED LAYER