Multiplexed identical broad-band-chirped grating interrogation system for large-strain sensing applications
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Photonics Technology Letters
- Vol. 9 (12) , 1616-1618
- https://doi.org/10.1109/68.643287
Abstract
We report here a simple and low-cost technique for extreme strain measurement. The overlapping of a chirped sensor grating with an identical reference device provides a novel mechanism for measuring strain. This system permits a linear relationship between strain and resultant optical power. The maximum sensing range of the system is determined by the bandwidths of the gratings employed. A 20-nm chirped grating facilitates a sensing range up to 20 000 /spl mu//spl epsiv/. This paper also demonstrates an arrangement for multiplexing up to four gratings, which can be rapidly and truly simultaneously interrogated.Keywords
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